簡單介紹：
ACS-2600-RTM
詳情介紹：
Leverages unique strengths of Keithley Series 2600B SourceMeter® instruments – including system scalability and measurement speed
System configurations from 2 to 44 channels
Comprehensive JEDEC-compliant test suite
Optimized for both emerging and mature technologies
Supports both sequential and parallel testing
Fully automatic single-site and multi-site capability
Compatible with all popular wafer probe stations
Real-time plotting and wafer mapping
